MaHui Portfolio: Suzhou Xihang Semiconductor Technology Co., Ltd. Secures Customer Order for 40nm BFI Equipment, Advancing Domestic Front-End Semiconductor Inspection

Recently, MaHui portfolio company Suzhou Xihang Semiconductor Technology Co., Ltd. (hereinafter referred to as "Xihang Semiconductor") announced that its self-developed bright-field nano-pattern wafer defect inspection equipment, the TB1500, has received a formal purchase order from a customer and is scheduled for delivery to the customer's fab.

As a core inspection tool for front-end semiconductor manufacturing, bright-field wafer defect inspection equipment has long been subject to overseas technology monopolies. The TB1500, targeting the 40nm process node, securing a formal customer order marks a major technological breakthrough for China in front-end microscopic defect inspection equipment — a critical milestone for building a self-controlled industrial ecosystem.

Xihang Semiconductor has now established a comprehensive bright-field defect inspection product matrix covering all process nodes, including the TB1000/TB1100 series (65-180nm), TB1500 (55/40nm), and TB2000 (28/14nm). These products are precisely matched to different technology nodes, addressing diverse defect inspection requirements across logic chips, memory chips, and other process types.

Going forward, Xihang Semiconductor will push toward even higher-precision semiconductor metrology and inspection, redefining the "quality line of defense" in chip manufacturing and accelerating the progress toward a self-controlled China semiconductor supply chain.